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03370 Effect of Vapor Phase Corrosion Inhibitor (VCI) on the Reliability of Thin Film Inductive Magnetic Recording Heads

Picture for 03370 Effect of Vapor Phase Corrosion Inhibitor
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Product Number: 51300-03370-SG
ISBN: 03370 2003 CP
Author: Kunigahalli L. Vasanth, Marcia Golub, Herman Pandana and Romel Gomez
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The reliability of thin film inductive magnetic recording heads under exposure to an elevated temperature and high humidity condition with and without saturated NaCl solution in the absence of a Vapor Phase Corrosion Inhibitor (VCI) emitter, and again in the presence of a VCI emitter has been studied. In the process all heads were characterized by spin stand tests and the chemical composition of the heads was analyzed before and after the exposure using a JEOL 8900 Electron Probe Microanalyzer with a Noran thin window Electron Dispersion Spectroscopy (EDS) Detector. A thin film magnetic recording head exposed to 80°C and 100%RH with distilled water failed after 21 days. Addition of salt water solution to above conditions accelerated the corrosion and resulted in head failure in 4 days. The cause of failure was mainly due to residue formation on magnetic poles, and formation of salt crystals in the presence of salt water. Exposing a thin film magnetic recording head to 80°C, 100%RH, distilled water and a VCI protected the head so that it was operable after 24 days. Finally, exposure of a thin film magnetic recording head to 80°C and 100%RH with NaCl solution and in the presence of a VCI resulted in head failure after 8 days. The failure of the head resulted from the corrosion of wires that connect magnetic poles to the rest of the assembly, because VCI could not protect microscopically thin wires from corrosion.
The reliability of thin film inductive magnetic recording heads under exposure to an elevated temperature and high humidity condition with and without saturated NaCl solution in the absence of a Vapor Phase Corrosion Inhibitor (VCI) emitter, and again in the presence of a VCI emitter has been studied. In the process all heads were characterized by spin stand tests and the chemical composition of the heads was analyzed before and after the exposure using a JEOL 8900 Electron Probe Microanalyzer with a Noran thin window Electron Dispersion Spectroscopy (EDS) Detector. A thin film magnetic recording head exposed to 80°C and 100%RH with distilled water failed after 21 days. Addition of salt water solution to above conditions accelerated the corrosion and resulted in head failure in 4 days. The cause of failure was mainly due to residue formation on magnetic poles, and formation of salt crystals in the presence of salt water. Exposing a thin film magnetic recording head to 80°C, 100%RH, distilled water and a VCI protected the head so that it was operable after 24 days. Finally, exposure of a thin film magnetic recording head to 80°C and 100%RH with NaCl solution and in the presence of a VCI resulted in head failure after 8 days. The failure of the head resulted from the corrosion of wires that connect magnetic poles to the rest of the assembly, because VCI could not protect microscopically thin wires from corrosion.
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