Electronic circuitry and components are subject to a variety of corrosion-related problems. Many of these problems are well documented in the literature and remedial measures are known.
However, failures continue to plague the industry. Others have seen many failure types or failure mechanisms, if only the knowledge could be disseminated. Some case histories have been presented previously. This paper will discuss additional case histories and their resolution. The cases discussed here include corroding glass seals on ICs,
corroded nichrome wire in resistors, electrically induced corrosion through leaking conductive coolant, and rusting cast locking devices. The latter is not an electronic device, but of interest for electronic enclosures.
Keywords: leaded glass, glass seals, lead oxide, steam age, nichrome, inorganic flux, diode block, sodium chromate coolant, silica mold, case histories