The passive film that forms on Alloy C22 was investigated by comparing/contrasting the results of
electrochemical tests conducted on Alloy C22 and chromium. A combination of cyclic polarization,
electrochemical impedance spectroscopy and Mott-Schottky analyses were used to (1) investigate the
passivation of Alloy C22 and (2) identify the passive films formed on Alloy C22 in 1 M NaCl + 0.1 M
H2SO4 at room temperature and at 90°C. The results indicate that the passive films formed on Alloy C22
exhibit semiconductor-like behavior. In particular, the passive films have n-type behavior and form an
inversion layer at their free surface at potentials above approximately +0.45V vs Ag/AgCl.
Measurements of capacitance suggest the passive films at room temperature and 90°C of both Alloy C22
and chromium are very thin (approximately = 1nm), even at potentials as high as +0.8V vs SCE. Mott-
Schottky analyses indicate the passive films of Alloy C22 and chromium behave as n-type
semiconductors, although both films’ carrier densities are high (~1x1021/cc). The Mott-Schottky plots
are functions of the frequency of the measurement but the frequency dependence can be
minimized/eliminated by replacing the capacitor in the sample’s equivalent circuit with a constant phase
element (CPE). The flatband potential of Alloy C22’s passive films is significantly higher (-0.10V) than
the flatband potential of chromium’s passive films (-0.70V), which correlates with the much faster
kinetics of H+ reduction on Alloy C22 than on chromium.