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97114 EFFECT OF SILICON ON INTERGRANULAR CORROSION OF STAINLESS STEEL IN NITRIC ACID SOLUTIONS

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Product Number: 51300-97114-SG
ISBN: 97114 1997 CP
Author: M. Sukekawa, T. Honda, T. Yokosuka, Y. Arai
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Corrosion mechanism of austenitic Fe-Cr-Ni alloys containing 0.06 -3.76%Si in Highly oxidizing HNO3 solutions have been studied by exposure testing, electrochemical polarization, high resolution analytical electron microscopy (HRAEM), and Auger electron spectroscopy (AES) techniques. Results of these studies indicate that intergranular corrosion of ~ 1%Si alloy is caused by galvanic coupling effect between Si-rich grain boundaries and normal grain faces. Lower Si-content alloys have high corrosion resistance by an absence of the effect and forming Cr-rich oxide films. Corrosion tests using laser surface melted alloy and coupons simulating a galvanic couple support the identified mechanism. Keywords : silicon, austenitic stainless steel, intergranular corrosion, general corrosion, nitric acid solution, bichromate, segregation, galvanic corrosion, laser surface melting, electrochemical measurement, grain boundary, microscopy
Corrosion mechanism of austenitic Fe-Cr-Ni alloys containing 0.06 -3.76%Si in Highly oxidizing HNO3 solutions have been studied by exposure testing, electrochemical polarization, high resolution analytical electron microscopy (HRAEM), and Auger electron spectroscopy (AES) techniques. Results of these studies indicate that intergranular corrosion of ~ 1%Si alloy is caused by galvanic coupling effect between Si-rich grain boundaries and normal grain faces. Lower Si-content alloys have high corrosion resistance by an absence of the effect and forming Cr-rich oxide films. Corrosion tests using laser surface melted alloy and coupons simulating a galvanic couple support the identified mechanism. Keywords : silicon, austenitic stainless steel, intergranular corrosion, general corrosion, nitric acid solution, bichromate, segregation, galvanic corrosion, laser surface melting, electrochemical measurement, grain boundary, microscopy
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